光學系統可製造性判斷之分析方法與裝置
刊登日期:2014/05/21
  ‧ 專利名稱 光學系統可製造性判斷之分析方法與裝置
  ‧ 公開號 US 2013-0297061 A1
  ‧ 專利權人 國立臺灣大學
  ‧ 專利國家
    (申請日)
美國 (2012/05/03)
 
  ‧ 發明人/PI 蔡坤諭,謝偉志,張伯森,
  ‧ 單位 電機工程學系
  ‧ 簡歷/Experience
技術摘要 / Our Technology:
A method of manufacturing an optical system is described. The method comprises designing at least one performance specification for an optical system, defining at least one fabrication parameter of a component of the optical system, fabricating the component according to the at least one fabrication parameter, obtaining at least one fabrication error of the component during the fabrication process, predicting at least one operation performance of the optical system by simulating with the at least one fabrication error, determining whether the operation performance corresponds with the at least one performance specification, and repeating fabricating the component by using at least one new parameter if the operation performance does not correspond with the at least one performance specification.




專利簡述 / Intellectual Properties:




 

聯繫方式 / Contact:
臺大產學合作總中心 / Center of Industry-Academia Collaboration, NTU
Email:ordiac@ntu.edu.tw 電話/Tel:02-3366-9945