STRAIN GAUGE APPARATUS HAVING A POINT-DISTRIBUTED SENSOR
  ‧ 專利名稱
  ‧ 專利證書號
  ‧ 專利權人 國立臺灣大學
  ‧ 專利國家
    (申請日)
美國 (2004/06/16)
  ‧ 發明人 Yu-Hsiang Hsu, 李世光,
 
技術摘要:
A strain gauge apparatus having a point-distributed sensor for measuring the strain of a mechanical structure. The strain gauge comprises a thin elongated piezoresistive lamina with a shape contour that is symmetric with respect to the longitudinal axis thereof, and the width of the lamina at the center along the longitudinal axis is minimum for the entire lamina length. The point-distributed strain gauge apparatus measures both static and dynamic deformation in the measured structure at a precise location aligned to the targeted center of the sensor lamina.




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