以電子電路預測電子元件電磁輻射特性之方法 刊登日期:2016/03/21
  ‧ 專利名稱 以電子電路預測電子元件電磁輻射特性之方法
  ‧ 專利證書號 I526695
US9568624
  ‧ 專利權人 國立臺灣大學
  ‧ 專利國家
    (申請日)
中華民國 (2014/12/11)
美國 (2015/01/21)
  ‧ 發明人 吳宗霖, 陳泓銓,
 
技術摘要:
A method for predicting electromagnetic radiation characteristics, a computer-readable recording medium and a simulator are provided. The method includes the steps of obtaining a plurality of first radiation currents in an equivalent circuit model of an electronic component, calculating a radiation resistance according to the first radiation currents, inserting the radiation resistance into the equivalent circuit model, and then obtaining a plurality of second radiation currents in the equivalent circuit model, and predicting electromagnetic radiation characteristics of the electronic component according to the second radiation currents.



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