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 具空間解析度和靈敏度改善的差動式近場磁場探針
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刊登日期：2015/06/11 |
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| ‧ 專利名稱 |
具空間解析度和靈敏度改善的差動式近場磁場探針 |
| ‧ 專利證書號 |
I509272
9606198
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| ‧ 專利權人 |
國立臺灣大學 |
‧ 專利國家
(申請日) |
中華民國 (2013/12/09)
美國 (2014/05/09)
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| ‧ 發明人/PI |
盧信嘉,周晏田,
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| ‧ 單位 |
電子工程學研究所
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| ‧ 簡歷/Experience |
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| 技術摘要 / Our Technology： |
A magnetic field probe, a magnetic field measurement system, and a magnetic field measurement method are provided. The magnetic field probe includes a probe head. The probe head includes a first and second inner metal layer. The first inner metal layer includes a first sensing part and a first connecting part coupled thereto. The first sensing part is configured for detecting a magnetic field signal of a device under test to form a first magnetic field distribution signal. The second inner metal layer includes a second sensing part and a second connecting part coupled thereto. The second sensing part is configured for detecting the magnetic field signal of the device under test to form a second magnetic field distribution signal. A distance between the first sensing part and the device under test is smaller than that between the second sensing part and the device under test.
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| 專利簡述 / Intellectual Properties： |
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聯繫方式 / Contact： |
| 臺大產學合作總中心 / Center of Industry-Academia Collaboration, NTU |
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| Email：ordiac@ntu.edu.tw |
電話/Tel：02-3366-9945 |
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