 技術摘要： |
一種透鏡量測裝置及其量測方法。該透鏡量測裝置包括：平行光源、第一極化片、第二極化片、待測鏡片以及影像分析模組；其量測方法係先使該平行光源依序通過第一極化片、待測鏡片、第二極化片以產生待測光束，再使影像分析模組分析待測光束之影像資訊，以判斷出該待測鏡片之結構中心與能量分佈，進而分析出該透鏡偏心與傾斜之誤差。由於該量測方法係採用一般平行光源，故能免除傳統使用準直雷射光源所需之繁複校正，並能輕易地於快速量產後同時檢測複數個待測鏡片，進而大幅降低量測時間與其量測成本。
A lens measuring device and method applied therein. The lens measuring device includes a light source, a first polarizer, a second polarizer, and an image analysis module. The method includes enabling the light source to orderly pass through the first polarizer, a lens to be measured, and the second polarizer to generate a light beam to be measured, and then enabling the image analysis module to analyze image-related information of the light beam to be measured, consequently deducing the structural center and energy distribution of the lens to be measured, and then further analyzing errors in polarity and skewness of the lens to be measured. By applying a common light source, the method is spared complicated correction that is otherwise required when a conventional collimating laser light source is applied, and the method can also easily and simultaneously test a plurality of lenses to be measured.
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聯繫方式 |
| 聯絡人：
研發處產學合作總中心 |
電話：
(02)3366-9949 |
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| 地 址：
10617臺北市大安區羅斯福路四段1號 禮賢樓六樓608室 |
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