國立臺灣大學-技術交易網

倍頻顯微術

刊登日期：2014/05/21

‧ 專利名稱	倍頻顯微術
‧ 專利證書號	200715(581863) 6922279B2
‧ 專利權人	國立臺灣大學
‧ 專利國家 (申請日)	中華民國 (2003/08/22) 美國 (2003/09/20)

‧ 發明人/PI	孫啓光 ,朱士維 ,
‧ 單位	光電工程學研究所
‧ 簡歷/Experience

技術摘要 / Our Technology：

一種倍頻顯微術，係利用雷射裝置發射具有給定波長範圍而不會在生物樣本上造成自發螢光反應之雷射光束，且其在激發後會產生二倍頻光及三倍頻光。接著藉由顯微鏡裝置將此雷射光束投射至被檢視的樣本上，並接收穿透過之觀察光束。將觀察光束導引通過分光裝置而使其分離成二倍頻部份和三部頻部份，再將二者轉換成相對應的電氣信號，並傳送至電腦裝置中加以處理，而形成相關的顯微影像。
A harmonic generation microscopy is disclosed in the present invention, in which a laser beam with a determined wavelength range emitted from a laser apparatus without causing self-generated fluorescent reaction onto the biologic sample is used. By using the microscopy apparatus, a laser beam is projected onto the tested sample and the penetrated viewing-beam is received. The viewing-beam is guided to pass through a light splitting apparatus to be split into the second harmonic part and the third harmonic part, which are then converted into the corresponding electric signals. The electric signals are sent to a computer apparatus where they are processed to form the related microscopic image.

聯繫方式 / Contact：

臺大產學合作總中心 / Center of Industry-Academia Collaboration, NTU

Email：ordiac@ntu.edu.tw	電話/Tel：02-3366-9945

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