表面電漿子共振感測系統及方法
Sensor system of surface plasmon resonance (SPR) and measuring method thereof
  ‧ 專利名稱 表面電漿子共振感測系統及方法
  ‧ 專利證書號 204996
US6,661,520B1
  ‧ 專利權人 國立臺灣大學
  ‧ 專利國家
    (申請日)
中華民國 (2001/12/21)
美國 (2002/05/22)
 
  ‧ 發明人/PI 林啟萬,黃啟裕,邱志鵬,劉盈村,薛順成,郭德盛,黃榮山,張培仁,楊龍杰,吳造中,林世明,李世光,
  ‧ 單位 醫學工程學研究所(醫)
  ‧ 簡歷/Experience
技術摘要 / Our Technology:
本案係指一種表面電漿子共振感測系統及方法,藉以分析一待測物質之特性,該系統包含:一光學裝置,藉以依序產生一第一光束及一第二光束;一感測裝置,其分別設置於一第一介電層及一第二介電層之間,且於該感測裝置及該第二介電層之間置放該待測物質,其中該感測裝置係因應該第一光束及該第二光束相對於該待測物質間之光學特性變化而分別產生一第一及一第二電漿波,又該第一及一第二電漿波則因該第一介電層及該第二介電層之折射率差異而產生共振,並分別形成一第一反射訊號及一第二反射訊號;以及一量測裝置,藉由測量該第一反射訊號及該第二反射訊號之光譜以獲得一測量值,並將該測量值代入一運算式中以計算出一參數值,其包括有折射係數、介電函數等參數及推算之厚度、表面密度、質量、體積密度與Z軸之不均勻度,進而得以分析該待測物質之特性。
A sensor system of a surface plasmon resonance (SPR) for analyzing a characteristic of a substance and the measuring method thereof are provided. The system includes an optical device for generating a first light beam and a second light beam in sequence; a sensor device for respectively generating a first plasmon wave and a second plasmon wave in response to an optical characteristic change of the first light beam and the second light beam with respective to the substance, in which a resonance is generated from the first plasmon wave and the second plasmon wave respectively generating a first reflective signal and a second reflective signal; and a measuring device for measuring spectra of the first reflective signal and the second reflective signal and obtaining the measured value which is substituted into an operational formula to calculate a reference value used for analyzing the characteristic of the substance.




市場需求 / Market Needs:
The biological substance can be efficiently analyzed by the sensor system.



 

聯繫方式 / Contact:
臺大產學合作總中心 / Center of Industry-Academia Collaboration, NTU
Email:ordiac@ntu.edu.tw 電話/Tel:02-3366-9945