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 一種利用頻率在300GHz以上的音波從事監測分析安裝成長沈積於固體表面之材料的方法
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刊登日期：2014/05/21 |
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| ‧ 專利名稱 |
一種利用頻率在300GHz以上的音波從事監測分析安裝成長沈積於固體表面之材料的方法 |
| ‧ 公開號 |
US 2014-0033821 A1
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| ‧ 專利權人 |
國立臺灣大學 |
‧ 專利國家
(申請日) |
美國 (2012/07/31)
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| ‧ 發明人/PI |
孫啟光,陳建誠,溫昱傑,
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| ‧ 單位 |
分子生醫影像研究中心
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| ‧ 簡歷/Experience |
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| 技術摘要 / Our Technology： |
The present disclosure provides solutions to probing an interface. With a noninvasive measuring device provided in one embodiment of the disclosure, an acoustic wave whose frequency is higher than approximately 300 GHz is generated to propagate in a buffering film. With measuring the reflection from the interface of an object to be measured interfacing with the buffering film, it is possible in one embodiment of the disclosure that at least one physical property of the interface may be analyzed, preferably with approximately 0.3 nm resolution.
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| 專利簡述 / Intellectual Properties： |
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聯繫方式 / Contact： |
| 臺大產學合作總中心 / Center of Industry-Academia Collaboration, NTU |
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| Email：ordiac@ntu.edu.tw |
電話/Tel：02-3366-9945 |
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