具空間解析度和靈敏度改善的差動式近場磁場探針
刊登日期:2015/06/11
  ‧ 專利名稱 具空間解析度和靈敏度改善的差動式近場磁場探針
  ‧ 專利證書號 I509272
9606198
  ‧ 專利權人 臺大
  ‧ 專利國家
    (申請日)
中華民國 (2013/12/09)
美國 (2014/05/09)
 
  ‧ 發明人/PI 盧信嘉,周晏田,
  ‧ 單位 電子工程學研究所
  ‧ 簡歷/Experience
技術摘要 / Our Technology:
A magnetic field probe, a magnetic field measurement system, and a magnetic field measurement method are provided. The magnetic field probe includes a probe head. The probe head includes a first and second inner metal layer. The first inner metal layer includes a first sensing part and a first connecting part coupled thereto. The first sensing part is configured for detecting a magnetic field signal of a device under test to form a first magnetic field distribution signal. The second inner metal layer includes a second sensing part and a second connecting part coupled thereto. The second sensing part is configured for detecting the magnetic field signal of the device under test to form a second magnetic field distribution signal. A distance between the first sensing part and the device under test is smaller than that between the second sensing part and the device under test.



專利簡述 / Intellectual Properties:




 

聯繫方式 / Contact:
臺大產學合作總中心 / Center of Industry-Academia Collaboration, NTU
Email:ordiac@ntu.edu.tw 電話/Tel:02-3366-9945