|
具空間解析度和靈敏度改善的差動式近場磁場探針 |
刊登日期:2015/06/11 |
|
|
|
|
‧ 專利名稱 |
具空間解析度和靈敏度改善的差動式近場磁場探針 |
‧ 專利證書號 |
I509272 9606198
|
‧ 專利權人 |
國立臺灣大學 |
‧ 專利國家
(申請日) |
中華民國 (2013/12/09) 美國 (2014/05/09)
|
‧ 發明人 |
盧信嘉, 周晏田, |
|
|
|
技術摘要: |
A magnetic field probe, a magnetic field measurement system, and a magnetic field measurement method are provided. The magnetic field probe includes a probe head. The probe head includes a first and second inner metal layer. The first inner metal layer includes a first sensing part and a first connecting part coupled thereto. The first sensing part is configured for detecting a magnetic field signal of a device under test to form a first magnetic field distribution signal. The second inner metal layer includes a second sensing part and a second connecting part coupled thereto. The second sensing part is configured for detecting the magnetic field signal of the device under test to form a second magnetic field distribution signal. A distance between the first sensing part and the device under test is smaller than that between the second sensing part and the device under test.
|
聯繫方式 |
聯絡人:
研發處產學合作總中心 |
電話:
(02)3366-9949 |
|
地 址:
10617臺北市大安區羅斯福路四段1號 禮賢樓六樓608室 |
|
|
|
|
|
|