光學式角度量測裝置
刊登日期:2014/05/21
  ‧ 專利名稱 光學式角度量測裝置
  ‧ 專利證書號 M387986
  ‧ 專利權人 國立臺灣大學
  ‧ 專利國家
    (申請日)
中華民國 (2010/04/30)
 
  ‧ 發明人/PI 范光照,陳希銘,林昇宜,
  ‧ 單位 機械工程學系
  ‧ 簡歷/Experience
技術摘要 / Our Technology:
一種光學式角度量測裝置,包括反射鏡、光源、1/4波片、極化分光鏡及光感測器。光源提供光束,1/4波片配置於反射鏡與光源之間,且位於光束的傳遞路徑上。1/4波片將光束轉換成第一偏振光束。極化分光鏡具有連接面,1/4波片配置於連接面上。極化分光鏡將第一偏振光束反射至反射鏡,反射鏡將第一偏振光束反射至1/4波片,1/4波片將第一偏振光束轉換成第二偏振光束,第二偏振光束通過極化分光鏡。光感測器配置於第二偏振光束的傳遞路徑上。反射鏡的微小角度偏轉可使第二偏振光束在光感測器上產生對應的微小位移。此光學式角度量測裝置的成本較低。
An optical angular measuring apparatus includes a reflective mirror, a light source, a 1/4 waveplate, a polarizing beamsplitter (PBS) and a photo sensor. The light source is adapted to provide a light beam, and the 1/4 waveplate is disposed between the reflective mirror and the light beam and is located at a transmission path of the light beam. The 1/4 waveplate is adapted to convert the light beam into a first polarized light beam. The PBS has a connection surface and the 1/4 waveplate is disposed on the connection surface. The PBS is adapted to reflect the first polarized light beam to the reflective mirror, and the reflective mirror is adapted to reflect the first polarized light beam to the 1/4 waveplate. The 1/4 waveplate is adapted to convert the first polarized light beam into a second polarized light beam. The second polarized light beam passes through the PBS. The photo sensor is disposed at a transmission path of the second polarized light beam. A small angular motion of the reflective mirror will result in a corresponding small displacement of the second polarized beam on the photo sensor. The optical angular measuring apparatus has an advantage of low cost.



專利簡述 / Intellectual Properties:




 

聯繫方式 / Contact:
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