半導體技術節點研究 刊登日期:2015/10/08
  ‧ 專利名稱 半導體技術節點研究
  ‧ 專利證書號 US9614079B2
  ‧ 專利權人 國立臺灣大學
  ‧ 專利國家
    (申請日)
美國 (2014/04/04)
  ‧ 發明人 廖洺漢,
 
技術摘要:
An integrated circuit structure includes a semiconductor substrate, and a gate stack over the semiconductor substrate. The gate stack includes a high-k gate dielectric over the semiconductor substrate, and a magnetic compound over and in contact with the high-k gate dielectric. A source region and a drain region are on opposite sides of the gate stack. The gate stack, the source region, and the drain region are portions of a Metal-Oxide-Semiconductor (MOS) device.



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