半導體技術節點研究
刊登日期:2015/10/08
  ‧ 專利名稱 半導體技術節點研究
  ‧ 專利證書號 US9614079B2
  ‧ 專利權人 國立臺灣大學
  ‧ 專利國家
    (申請日)
美國 (2014/04/04)
 
  ‧ 發明人/PI 廖洺漢
  ‧ 單位 機械工程學系
  ‧ 簡歷/Experience
技術摘要 / Our Technology:
An integrated circuit structure includes a semiconductor substrate, and a gate stack over the semiconductor substrate. The gate stack includes a high-k gate dielectric over the semiconductor substrate, and a magnetic compound over and in contact with the high-k gate dielectric. A source region and a drain region are on opposite sides of the gate stack. The gate stack, the source region, and the drain region are portions of a Metal-Oxide-Semiconductor (MOS) device.



專利簡述 / Intellectual Properties:




 

聯繫方式 / Contact:
臺大產學合作總中心 / Center of Industry-Academia Collaboration, NTU
Email:ordiac@ntu.edu.tw 電話/Tel:02-3366-9945